Takashi Yamazaki 24th Australian Conference on Microscopy and Microanalysis 2016

Takashi Yamazaki

Takashi Yamazaki received Doctor of Science from the Tokyo University of Science in Japan in 2004. Since 1999, he has investigated structural analysis at atomic resolution by transmission electron microscopy (TEM). Since 2008, he has been with FUJITSU Laboratories, and engaged in the investigation of nanometre scaled quantitative analysis of electronic devices by using TEM. Since 2009, he has engaged in the study of numerical optimization for quantitative analysis of analytical techniquea.

Abstracts this author is presenting: