Peter J. Hines
24th Australian Conference on Microscopy and Microanalysis 2016
Days
Sunday, 31st January
Monday, 1st February
Tuesday, 2nd February
Wednesday, 3rd February
Thursday, 4th February
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Speakers
Peter J. Hines
Abstracts this author is presenting:
Flood gun parameters for charge control during imaging of insulating samples by Helium Ion Microscopy (HIM)
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Session 17 - SEM, HIM and Microanalysis 2