Stefan Zaefferer 24th Australian Conference on Microscopy and Microanalysis 2016

Stefan Zaefferer

Stefan Zaefferer studied physical metallurgy and metal physics at the TU Clausthal in Germany where he also carried out his PhD thesis on TEM-investigations of deformation mechansism of Ti alloys. Following this SZ spent several years as post doc in Paris and in Kyoto. There he focussed mainly on the deformation and recrystallization mechanisms of metals with fcc crystal structure by TEM and developed the computer program TOCA for on-line for indexing of TEM and SEM diffraction patterns and microscope control. Since 2000 SZ is head of the research group „Microscopy and Diffraction“ at the Max-Planck-Institut für Eisenforschung (MPIE). Currently the main interests of his 10-15 people research group are the development of electron diffraction techniques for scanning electron microscopy (SEM), namely electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI), and the application of these methods to understand microstructure evolution and properties of various structural and functional materials. Two current examples of research are on the role of grain boundaries in CdTe solar cells, studied by a combination of 3D EBSD and cathodoluminescence, and on the origin of fracture in DP steels, investigated by EBSD coupled with micrometric deformation experiments. Besides researchb Stefan Zaefferer is an active university lecturer at the RWTH Aachen, Germany, as well as guest professor at various universities (currently Vienna, Vancouver, Melbourne) with classes on “Electron diffraction methods in the SEM Microstructures”, and “Microstructures, Microscopy and Modelling“. He published approximately 100 peer-reviewed papers and has given many invited lectures.