Philip E. Batson 24th Australian Conference on Microscopy and Microanalysis 2016

Philip E. Batson

Philip E. Batson is a Distinguished Research Professor at the Institute for Advanced Materials, Devices and Nanotechnology, Rutgers University, with appointments in Physics, and Materials Science, after retirement from the IBM Thomas J. Watson Research Center in 2009. His education was at Cornell University, receiving the Ph.D. in 1976. After post-doctoral work at the Cavendish Laboratory, he moved to IBM in 1978. During the 1980’s he pioneered spatially resolved Electron Energy Loss Spectroscopy in the Scanning Transmission Electron Microscope, with studies of surface plasmon scattering in metal nanoparticle systems. Later, he explored local electronic structure in Si-Ge based materials, obtained from detailed shapes of the Si 2p core loss excitation. In 2002, he demonstrated for the first time sub-Angstrom spatial resolution using aberration correction electron optics, and is presently using this capability to investigate lateral dielectric forces in sub-nanometer sized metal particles. At Rutgers he has recently begun exploring milli-eV energy excitations using a monochromated STEM. He is a Fellow of the American Physical Society and the Microscopy Society of America.