Sarah J Haigh 24th Australian Conference on Microscopy and Microanalysis 2016

Sarah J Haigh

Sarah Haigh is a Lecturer in Materials Characterisation at the University of Manchester, UK. Her research interests centre on improving our understanding of nanomaterials properties using transmission electron microscope (TEM) imaging and analysis techniques. Recent examples of work from her group include imaging of new 2D heterostructure materials (Withers et al Nature Materials 2015), three dimensional elemental imaging of nanoparticles (Slater et al, Nano Letters, 2014), and ‘in situ’ elemental analysis where samples are analysed in liquids or gases at elevated temperature (Lewis et al Chem Comm,2014, Lewis et al Nanoscale 2014). Before moving to her current position at the University of Manchester in 2010 she worked as consultant application specialist to JEOL UK. She completed undergraduate and doctorate degrees in Material Science at the University of Oxford. In her doctoral studies she developed exit wave restoration techniques from series of high resolution TEM images under the supervision of Prof Angus Kirkland. She is fortunate to have been supported by the Worshipful Company of Armourers and Brasiers and Alcan Ltd. She was elected to join the Armourers and Brasiers Company as a freeman in 2009 and now sits on their Material Science Committee. She is Honorary treasurer and secretary of the Institute of Physics EMAG group and on the advisory board for the EPSRC’s SuperSTEM laboratory.