Hendrix Demers 24th Australian Conference on Microscopy and Microanalysis 2016

Hendrix Demers

Hendrix Demers is a Research Associate in material engineering department at McGill University, Canada since 2012. Hendrix received his Bachelor’s in Physics at the University of Sherbrooke, Canada, Master’s degree in Mechanical Engineering at the University of Sherbrooke, Canada and his PhD in Mining and Materials Engineering at the McGill University, Canada. Before joining McGill University he was a postdoctoral fellow at Universite de Sherbrooke and at College of Nanoscale Science and Engineering University at Albany, SUNY. He is involved in the field of microscopy and microanalysis by working on x-ray fluorescence quantification algorithm, microanalysis of insulators and development of the microcalorimeter x-ray detector. He is also author of a world-renowned research program (Win X-Ray) on imaging simulation and complete of the X-ray spectrum software for the scanning electron microscope. This Monte Carlo software aims at helping SEM users in their X-ray microanalyses, metrology applications and also in more advanced applications such as electron beam lithography. This software is available on the Internet (http://montecarlomodeling.mcgill.ca/software/winxray/winxray.html) and used by many users worldwide.