Atom probe microscopy is a powerful technique for gaining insights into the chemistry and structure of materials at the atomic scale [1]. Challenges still remain, however, in the area of accurate reconstruction, especially as the captured data increases in length along the analysis direction. Careful studies have been made to explore the dynamic nature of the "constants" used during the reconstruction, yet no solution was proposed beyond linking simulation with experiment [2]. In this work, a method for dynamic reconstruction is proposed, that is dependent on the knowledge of the voltage of each ion captured during the experiment. The results in some basic crystalline systems (fcc, bcc, hcp) show that this is a promising general method for dynamic reconstruction for atom probe tomography.
Acknowledgements: The authors acknowledge the facilities and the scientific and technical assistance of the Australian Microscopy & Microanalysis Research Facility at the Australian Centre for Microscopy & Microanalysis at the University of Sydney.