Advances in x-ray detector technology are lowering the energy that can be measured, opening exciting new possibilities for microanalysis. Energy dispersive spectrometers (EDS) can now detect x-rays with energies as low as Mg-L (49eV), while the soft x-ray emission spectrometer (SXES) can measure similarly low energies but with much higher energy resolution. CSIRO has recently installed a JEOL 8530 field emission microprobe equipped with WDS, two Bruker SDDs (both windowed and windowless), SXES and a cathodoluminescence (CL) spectrometer. The SXES is equipped with a grating spectrometer and by observing higher order reflections most elements across the periodic table can be measured. Soft x-ray analysis is not new to electron microprobes. Traditional wavelength dispersive spectrometers (WDS) have been able to measure down to ~100 eV, and while not having a constant energy resolution across their energy range, WDS can have resolution high enough to measure peak shape and shifts for certain elements. One key disadvantage in using WDS is that it is monochromatic, and so the spectrometer must be mechanically scanned over an energy range to measure peak position and shape changes. In contrast the SXES detector uses a variable-line-spaced grating to disperse the x-rays across a CCD detector, allowing a fixed energy interval to be measured in parallel. The SXES detector also offers the ability to achieve better energy resolution across its whole range than standard WDS detectors, achieving resolutions as low as 200meV, and since the spectra are collected in parallel, it makes spectral mapping in the soft x-ray region feasible. We have integrated all x-ray and optical spectrometers in our JEOL 8530 allowing the WDS, EDS, SXES, CL and electron signals to be collected in parallel, measuring spectra from multiple detectors at each pixel, resulting in hyperspectral maps ranging in energy from 0.7eV to 20keV.