Poster Presentation 24th Australian Conference on Microscopy and Microanalysis 2016

Aberration-corrected electron microscopy investigation of multiple twinning and {111} planar faults in epitaxial LaBaCo2O5.5+δ thin films (#244)

Jiangbo Lu 1 , Shaobo Mi 1 , Ming Liu 1 , Chunlin Jia 1 2
  1. Xi’an Jiaotong University, Xi’an 710049, People’s Republic of China
  2. Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
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  1. [1] Ma, C.R. et al. ACS Appl. Mater. Interfaces 2014, 6, 2540
  2. [2] Kundu, A. K. et al. Phys. Rev. B 2007, 76, 184432
  3. [3] Liu, M. et a.Appl. Phys. Lett. 2010, 96, 132106.