Modern analytical electron microscopes equipped with both x-ray and electron loss spectrometers now allow for a wide range of configurations capable of performing qualitative as well as quantitative spectrometry both in-vacuuo as well as during in-situ experiments. Recent developments have improved the temporal and/or geometrical collection capabilities of these systems. In this work we will discuss and compare some recent experimental and theoretical results for a range configurations to assess the impact on analytical sensitivity in current and the future "Lab-in-the-Gap" electron-optical instruments.